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Application of soft x-ray appearance potential spectroscopy to light lanthanides, 4d transition metals, and insulators

Thesis/Dissertation ·
DOI:https://doi.org/10.2172/4171986· OSTI ID:4171986
 [1]
  1. Iowa State Univ., Ames, IA (United States)
Evaporated films of La, Ce, Yb, Y, Ag--Mn(5 percent), KCl, MnF2, CsCl and LaF3 were studied using the soft x-ray appearance potential spectroscopy (SXAPS) technique. Studies were also made of bulk polycrystalline samples of Y, Zr, Nb, and Mo. The results are discussed in terms of existing SXAPS theories. Several similarities between soft x-ray absorption (SXA) data and the SXAPS results are discussed, and it is shown that the SXA data can aid in the interpretation of SXAPS spectra when using the well-known self-convolution model. In this approximation the absorption coefficient, α(E), is substituted for the density of states, N(E-Ec) → α(E). For more localized excitations, a convolution of α(E) with bremsstrahlung isochromat data, based on Wendin's two density of states formalism is used to predict SNAPS results.
Research Organization:
Ames Lab., Ames, IA (United States)
Sponsoring Organization:
US Energy Research and Development Administration (ERDA)
DOE Contract Number:
W-7405-ENG-82
NSA Number:
NSA-33-001244
OSTI ID:
4171986
Report Number(s):
IS-T--684
Country of Publication:
United States
Language:
English