Determination of near-surface material properties by line-focus acoustic microscopy
Conference
·
OSTI ID:415060
- Northwestern Univ., Evanston, IL (United States)
A line-focus acoustic microscope is used in conjunction with a multiple wave-mode method to determine elastic constants from a single V(z) measurement. V(z) curves which include contributions from different wave modes, measured using the line-focus acoustic microscope at 225 MHz, have been compared with theoretical results predicted by a V(z) measurement model. The determination of elastic constants has been achieved numerically by seeking a set of elastic constants that leads to the best fit, in the least square sense, of the theoretical results to the experimental ones. The method has been applied to isotropic materials in bulk, and plate and thin-film configurations. Elastic constants for each of these cases have been determined. The consistency, convergence, sensitivity and accuracy of the procedure have been investigated.
- Research Organization:
- Argonne National Lab., IL (United States)
- DOE Contract Number:
- FG02-86ER13484
- OSTI ID:
- 415060
- Report Number(s):
- CONF-9605186--; ON: DE96015339
- Country of Publication:
- United States
- Language:
- English
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