High resolution I{sub DDQ} characterization and testing -- Practical issues
Conference
·
OSTI ID:414408
I{sub DDQ} testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I{sub DDQ} characterization and testing (from the sub-nA to {micro}A level) and outlines test hardware and software issues. The physical basis of I{sub DDQ} is discussed. Methods for statistical analysis of I{sub DDQ} data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 414408
- Report Number(s):
- SAND-96-2462C; CONF-9610208-1; ON: DE97000741; TRN: AHC29701%%107
- Resource Relation:
- Conference: 1996 Institute of Electrical and Electronics Engineers (IEEE) international test conference, Washington, DC (United States), 21-25 Oct 1996; Other Information: PBD: [1996]
- Country of Publication:
- United States
- Language:
- English
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