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Design of stable thin-film Josephson tunnel junctions for the maintenance of voltage standards

Conference · · IEEE Trans. Magn., v. MAG-11, no. 2, pp. 817-820
OSTI ID:4121897

The behavior of Josephson tunnel junctions was theoretically investigated in order to determine the junction preparation parameters which allow one to obtain a junction, which, when subjected to microwave radiation, produces a convenient constantvoltage current step structure at high bias voltages. Major junction characteristics (geometrical dimensions, normal tunnel resistance R/sub N/, and critical current I$sub 0$, for example) are taken into account, as well as various coupling conditions between junction and microwave radiation. Stable Nb--oxide--Pb junctions having various electrical characteristics for rather different geometrical dimensions were prepared and tested. The experimental results are in good agreement with our calculations. (auth)

Research Organization:
LCIE and LGEP, Fontenay-aux-Roses, France
NSA Number:
NSA-33-017112
OSTI ID:
4121897
Journal Information:
IEEE Trans. Magn., v. MAG-11, no. 2, pp. 817-820, Journal Name: IEEE Trans. Magn., v. MAG-11, no. 2, pp. 817-820; ISSN IEMGA
Country of Publication:
United States
Language:
English