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ION SOURCE FOR MASS SPECTROMETER

Patent ·
OSTI ID:4118899
An ion source that can produce ions from low-vaporpressure samples, high- vapor-pressure samples, or mixtures either independently or simultaneously is patented. The casing for the ion source has a pair of hollow doublewalled sides connected by a flat bottom wall containing an outlet slit. One hollow wall contains a cathode, and the other wall contains an anode and eiectron trap. Sample gases to be ionized are introduced into a removable ionization chamber between the hollow walls. Apertures in the walls of the casing and removable chamber are aligned so that electrons can be accelerated from the cathode to the anode and ionize the gases in the removable chamber by electronic collision. The ions pass through outlet slits in the bottom of the chamber and casing. The removable chamber also contains two pairs of electrodes for thermal ionization of low-vapor-pressure samples. The thermal electrode system can be used simultaneously with or independently of the electrode system in the casing walls. The thermal ion source may be replaced by removing the ionization chamber. Use of an air lock with the mass spectrometer permits the chamber to be removed or replaced without loss of vacuum. (M.P.G.)
Research Organization:
Originating Research Org. not identified
NSA Number:
NSA-18-007024
Assignee:
Atlas-Werke Aktiengesellschaft
Patent Number(s):
US 3115591
OSTI ID:
4118899
Country of Publication:
United States
Language:
English

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