Single-crystal silicon-barrier Josephson junctions
Conference
·
· IEEE Trans. Magn., v. MAG-11, no. 2, pp. 766-769
OSTI ID:4094589
1250A-thick silicon-barrier Josephson junctions were made and tested. The junctions tested show supercurrent and have junction characteristics which may be useful for high-frequency applications. A detailed junction fabrication process and the effects of surface oxides on the junction characteristics are described. (auth)
- Research Organization:
- Univ. of California, Berkeley
- NSA Number:
- NSA-33-017098
- OSTI ID:
- 4094589
- Conference Information:
- Journal Name: IEEE Trans. Magn., v. MAG-11, no. 2, pp. 766-769
- Country of Publication:
- United States
- Language:
- English
Similar Records
Resonant tunneling in amorphous-silicon-barrier Josephson junctions
Ge-Sn barrier Josephson tunnel junctions
Josephson tunneling through Ge-Sn barriers
Journal Article
·
Thu Dec 14 23:00:00 EST 1989
· Journal of Applied Physics; (USA)
·
OSTI ID:7021217
Ge-Sn barrier Josephson tunnel junctions
Journal Article
·
Mon May 01 00:00:00 EDT 1978
· Appl. Phys. Lett.; (United States)
·
OSTI ID:5093669
Josephson tunneling through Ge-Sn barriers
Conference
·
Sat Dec 31 23:00:00 EST 1977
· AIP Conf. Proc.; (United States)
·
OSTI ID:5256236
Related Subjects
*JOSEPHSON JUNCTIONS-- PERFORMANCE TESTING
420201* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
CRITICAL CURRENT
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
IMPURITIES
MONOCRYSTALS
N42220* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
SILICON
420201* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
CRITICAL CURRENT
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
IMPURITIES
MONOCRYSTALS
N42220* --Engineering--Facilities & Equipment--Cryogenic & Superconducting Equipment & Devices
SILICON