Profile studies of hydrogen trapping in metals due to ion damage
The retention of hydrogen isotopes in Mo at room temperature after ion implantation damage has been studied by measurements of H depth profiles and total D retained in the near-surface region. Implantations of He, O, Ne, and Bi in a fluence range 3x10$sup 14$--2x10$sup 17$/cm$sup 2$ were followed by 8-keV hydrogen bombardment to fluences of 2x10$sup 15$--2x10$sup 17$/cm$sup 2$. Large enhancements in the amount of hydrogen retained in preimplanted samples over samples without prior implantation have been observed and are interpreted in terms of damage trapping. For a given predamage ion fluence hydrogen retention increases linearly with hydrogen fluence until a saturation level is reached. Increased predamage fluence results in increased saturation level for hydrogen trapping, with average concentrations as high as approx.10 at.% achieved. An ion- mass dependence indicates that the lighter ions, which create fewer primary displacements, are more effective in hydrogen trapping, suggesting a dependence on the damage density in the ion cascades. (AIP)
- Research Organization:
- Institute of Physics, University of Aarhus, DK-800 Aarhus C, Denmark
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-33-020851
- OSTI ID:
- 4084769
- Journal Information:
- Appl. Phys. Lett., v. 28, no. 4, pp. 179-181, Other Information: Orig. Receipt Date: 30-JUN-76
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
Ceramics
& Other Materials-Metals & Alloys-Radiation Effects
360106* -Materials-Metals & Alloys-Radiation Effects
*MOLYBDENUM- PHYSICAL RADIATION EFFECTS
*NIOBIUM- PHYSICAL RADIATION EFFECTS
ANNEALING
BISMUTH IONS
CRYSTAL DEFECTS
DEPTH DOSE DISTRIBUTIONS
DEUTERIUM IONS
HELIUM IONS
HYDROGEN IONS
ION IMPLANTATION
MOLECULAR BEAMS
NEON IONS
NUCLEAR REACTION ANALYSIS
OXYGEN IONS
TRAPPING