A DATA ACQUISITION SYSTEM FOR THE STUDY OF TRANSIENT RADIATION EFFECTS ON ELECTRONIC DEVICES. Paper 5 of FOURTH RADIATION EFFECTS SYMPOSIUM, SEPTEMBER 15-16, 1959, CINCINNATI, OHIO. GENERAL SESSION PAPERS

Technical Report · Tue Oct 31 00:00:00 EST 1961

OSTI ID:4084306

Cochrane, D O; Graham, F E; Sauer, H S; Strabala, F I

ning both the transient and permanent effects that an environment of the type created by a nuclear detonation or a pulsed reactor exerts on electronic devices, is described. The design of suitable test heads for containing the electronic devices is discussed. The design of a blockhouse for use near Ground Sero when evaluating components in a weapons environment is also discussed. (C.J.G.)

• Research Organization: Edgerton, Germeshausen and Grier, Inc., Boston
• NSA Number: NSA-15-005424
• OSTI ID: 4084306
• Report Number(s): NP-9333(Vol.I)(Paper 5)
• Resource Relation: Other Information: Orig. Receipt Date: 31-DEC-61
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

METALS, CERAMICS, AND OTHER MATERIALS
ELECTRONIC EQUIPMENT
ENVIRONMENT
NUCLEAR EXPLOSIONS
PLANNING
PULSES
RADIATION EFFECTS
REACTORS
RECORDING SYSTEMS
TESTING
TRANSIENTS