Reciprocating and fixed probe measurements of n{sub e} and T{sub e} in the DIII-D divertor

Conference · Thu Oct 31 23:00:00 EST 1996

OSTI ID:405718

Watkins, J G ^[1]; Moyer, R A; Cuthbertson, J W ^[2]; Buchenauer, D A ^[1]; Carlstrom, T N ^[3]; Hill, D N ^[4]; Ulrickson, M ^[1]

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1. Sandia National Labs., Albuquerque, NM (United States)
2. California Univ., San Diego, La Jolla, CA (United States)
3. General Atomics, San Diego, CA (United States)
4. Lawrence Livermore National Lab., CA (United States)

This paper describes divertor density and temperature measurements using both a new reciprocating Langmuir probe (XPT-RCP) which plunges vertically above the divertor floor up to the X-point height and swept, single, Langmuir probes fixed horizontally across the divertor floor. These types of measurements are important for testing models of the SOL and divertor which then are used to design plasma facing components in reactor size tokamaks. This paper presents an overview of the new divertor probe measurements and how they compare with the new divertor Thomson scattering system. The fast time response of the probe measurements allows detailed study of ELMs.

• Research Organization: Sandia National Labs., Albuquerque, NM (United States)
• Sponsoring Organization: USDOE Office of Energy Research, Washington, DC (United States)
• DOE Contract Number: AC04-94AL85000; W-7405-ENG-48; AC03-89ER51114; FG03-95ER54294
• OSTI ID: 405718
• Report Number(s): SAND--96-2782C; GA-A--22362; CONF-960569--13; ON: DE97001319; CNN: AT501020000
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
DIVERTORS
DOUBLET-3 DEVICE
ELECTRON DENSITY
ELECTRON TEMPERATURE
LANGMUIR PROBE