Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

HALL COEFFICIENT AND RESISTIVITY OF A Mg$sub 2$Si SINGLE CRYSTAL FROM 4 K TO 300 K

Technical Report ·
DOI:https://doi.org/10.2172/4045072· OSTI ID:4045072

The Hall coefficient and resistivity of an n-type single crystal of Mg/ sub 2/Si with a room temperature carrier concentration of 3.5 x 10/sup 1//sup 7/ cm/sup -//sup 3/ was measured at 4.2 to 300 deg K. The Hall coefficient reached a peak value of 220 cm/sup 3// coulomb at a temperature of 17.4 deg K and a saturation value of 76 cm/sup 3//coulomb below a temperature of about 7 The Hall mobility of the sample had a temperature dependence of T/sup -//sup 2//sup ./ /sup 2/ at high temperatures and a temperatare dependence of T/sup +//sup 3//sup .//sup 1/ at low temperatures. The high-temperature measurements confirmed, but added nothing new, some of the work of Morris, Redin, and Danielson. The lowtemperature measurements suggest a donor impurity level at 0.0045 ev below the conduction band. The low temperature data seemed to agree self-consistently with a theory of weak impurity-band conduction. On the basis of this theory, a crude estimate of the percentage of acceptor impurities compensated by donor impurities was found to be 50 plus or minus 25%. (auth)

Research Organization:
Ames Lab., Ames, Iowa
NSA Number:
NSA-15-022719
OSTI ID:
4045072
Report Number(s):
ISC-1176
Country of Publication:
Country unknown/Code not available
Language:
English

Similar Records

RESISTIVITY, HALL CONSTANT, AND SEEBECK COEFFICIENT OF CsAu
Journal Article · Mon Jul 15 00:00:00 EDT 1963 · Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D · OSTI ID:4696049

Electrical and thermoelectric properties of ZnO under atmospheric and hydrostatic pressure
Journal Article · Tue Nov 14 23:00:00 EST 2006 · Semiconductors · OSTI ID:21088646

On the resonant donor level in n-CdTe according to data on electron transport under hydrostatic pressure
Journal Article · Fri Jan 14 23:00:00 EST 2011 · Semiconductors · OSTI ID:22004895