Spectrometer performance of n-type cadmium telluride x- and $gamma$-ray detectors

Conference · Sun Feb 01 04:00:00 EST 1976 · IEEE Trans. Nucl. Sci., v. NS-23, no. 1, pp. 171-176

OSTI ID:4043991

Dabrowski, A J; Chwaszczewska, J; Iwanczyk, J; Triboulet, R; Marfaing, Y

Highly perfect n-type CdTe single crystals grown by the sealed-ingot- zone refining method have been used to fabricate semiconductor surface-barrier detectors for X- and low-energy $gamma$-ray analysis. An energy resolution of 2.0 keV (fwhm) and 1.5 keV (fwhm) was achieved for 59.5 keV $gamma$-rays from $sup 241$Am and 5.9 keV characteristic K X-ray line from $sup 55$Fe source, respectively. Spectra were measured at room temperature with low detector bias. The observed full energy peak of 59.5 keV $gamma$-rays has been compared with the theoretical peak calculated for a surface-barrier junction with fixed space charge, the trapping effects being taken into account. (auth)

• Research Organization: Inst. of Nuclear Research, Swierk, Poland
• NSA Number: NSA-33-029361
• OSTI ID: 4043991
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci., v. NS-23, no. 1, pp. 171-176
• Country of Publication: United States
• Language: English

Related Subjects

*CDTE SEMICONDUCTOR DETECTORS-- PERFORMANCE
*GAMMA SPECTROMETERS-- CDTE SEMICONDUCTOR DETECTORS
*X-RAY SPECTROMETERS-- CDTE SEMICONDUCTOR DETECTORS
440103* --Instrumentation--Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
ENERGY RESOLUTION
N46130* --Instrumentation--Radiation Detection Instruments-- Nuclear Spectroscopic Instrumentation
SURFACE BARRIER DETECTORS