Microoptical characterization of electroluminescent SrS:Cu,Ag thin films by photo- and cathodoluminescence observations
Journal Article
·
· Journal of Applied Physics
For SrS:Cu,Ag thin film phosphors, a postdeposition annealing step is imperative in order to obtain bright photo- or electroluminescence. However, it is not clear to date what is the most important effect of this treatment, a recrystallization of the host lattice or a redistribution of the activators. The present article discusses the microscopic emission characteristics of annealed photoluminescent layers SrS:Cu,Ag. Using cathodoluminescence measurements, it is shown that emission, originating from the grain boundaries, is very weak compared to the emission from the bulk of the grains. {copyright} 2001 American Institute of Physics.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204360
- Journal Information:
- Journal of Applied Physics, Vol. 90, Issue 1; Other Information: DOI: 10.1063/1.1379350; Othernumber: JAPIAU000090000001000248000001; 045114JAP; PBD: 1 Jul 2001; ISSN 0021-8979
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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