Grain growth in Co{sub 27}Pt{sub 73} alloy films with perpendicular magnetic anisotropy

Journal Article · Fri Jun 15 04:00:00 EDT 2001 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1372370· OSTI ID:40204226

Xun, Kun; Shen, Defang

The grain size of Co{sub 27}Pt{sub 73} alloy films as-deposited and annealed at 250{degree}C has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The grain size was found to increase from 4{endash}8 to 20{endash}35 nm when the thickness of the films changed from 7 to 49 nm, while the magnetic anisotropy constants of the films increased from 0.048 to 0.28 MJ/m3. The grain size increase was found to be independent of the growth time, but dependent on the film thickness. Significant stress in the Co{sub 27}Pt{sub 73} alloy films was revealed by the difference between the grain sizes determined by the Scherrer equation and TEM. Evidence and analysis indicate that the local anisotropy structure resulting in perpendicular magnetic anisotropy in Co{sub x}Pt{sub 1{minus}x} (x{approximately}0.25) alloy films may be stable at 250{degree}C. {copyright} 2001 American Institute of Physics.

• Sponsoring Organization: (US)
• OSTI ID: 40204226
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 12 Vol. 89; ISSN 0021-8979
• Publisher: The American Physical Society
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALLOYS
ANISOTROPY
GRAIN GROWTH
GRAIN SIZE
PHYSICS
THICKNESS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION