QUANTITATIVE SPECTROGRAPHIC DETERMINATION OF IMPURITIES IN TANTALUM AND ITS COMPOUNDS BY D.C. ARC METHOD

Journal Article · Wed Jan 01 04:00:00 EST 1964 · Nippon Kinzoku Gakkaishi (Japan)

OSTI ID:4015617

Oda, N; Idohara, M

Recent developments of the tantalum refining industry made it necessary to determine the trace impurities in the high purity tantalum products. To meet the requirement of increasing sensitivity, a spectrographic d-c arc method was studied with a medium quartz spectrograph Qu-24. Experiments were carried out to establish the optimum conditions in regard to the various factors, such as carrier, arc current, exposure time, internal standard, analytical line pairs, etc., yielding a sensitive, simple, and rapid method, suited for practical uses. The method includes converting sample to oxide, mixing with carbon powder, which contains two internal standard materials (GeO/sub 2/, BeO), arcing in a d-c arc, and photographing spectra with a medium quartz spectrograph. The method can be applied to the analysis of the high purity tantalum products of various forms that could be brought into tantalum oxide, and used to determine the fourteen elements in them at the concentrations greater than: 0.01% of Nb, W; 0.003% of Mo; 0.001% of Ti; 0.0005% of Fe, Ca; 0.0003% of Si, Cr, V, Ni, Al; 0.0001% of Mn, Cu; and 0.00003% of Mg, with the precision of about 10%, in terms of the variation coefficient. (auth)

• Research Organization: Nippon Soda Co., Takaoka, Japan
• NSA Number: NSA-18-019894
• OSTI ID: 4015617
• Journal Information: Nippon Kinzoku Gakkaishi (Japan), Journal Name: Nippon Kinzoku Gakkaishi (Japan) Vol. Vol: 28; ISSN NIKGA
• Country of Publication: Country unknown/Code not available
• Language: Japanese

Related Subjects

ALUMINUM
CALCIUM
CARBON
CARRIERS
CHEMISTRY
CHROMIUM
COPPER
CURRENTS
ELECTRIC ARCS
IMPURITIES
IRON
MAGNESIUM
MANGANESE
MIXING
MOLYBDENUM
NICKEL
NIOBIUM
OXIDATION
PHOTOGRAPHY
QUANTITATIVE ANALYSIS
SILICON
SPECTROSCOPY
STANDARDS
TANTALUM
TANTALUM COMPOUNDS
TANTALUM OXIDES
TITANIUM
TRACE AMOUNTS
TUNGSTEN
VANADIUM