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A vertically rotating double-crystal x-ray spectrometer

Conference ·
OSTI ID:4012177
A versatile double crystal x-ray spectrometer has been developed for the precise measurement of x-ray diffraction line-widths to tenths of seconds. The device can be employed in either the parallel or anti-parallel arrangement for rocking curve studies and can also be used in anomalous x-ray transmission experiments with nearly perfect crystals. A detailed description of the instrument is given as well as some results concerning the Darwin theory of x-ray diffraction line-widths and Borrmann effects. (auth)
Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
US Atomic Energy Commission (AEC)
NSA Number:
NSA-18-041729
OSTI ID:
4012177
Report Number(s):
CONF-174--4
Country of Publication:
United States
Language:
English

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