The effect of oxygen deposition pressure on the structure and properties of pulsed laser deposited La{sub x}Ca{sub 1{minus}x}MnO{sub {delta}} films
Book
·
OSTI ID:392205
- Naval Research Lab., Washington, DC (United States); and others
Thin films ({approximately}1,000 {angstrom}) of La{sub x}Ca{sub 1{minus}x}MnO{sub {delta}} (x=0.67) were deposited onto LaAlO{sub 3} (100) substrates at 600 and 700 C. Varying the oxygen deposition pressure between 15 and 400 mTorr systematically changed the oxygen concentrations in the as deposited films. As-deposited films exhibited an orthorhombic structure with an oxygen pressure dependent lattice parameter. The films were highly oriented as characterized by narrow x-ray {omega}-scans (FWHM {le} 0.16--0.70{degree}). At low pressures, the films were preferentially (202) oriented while at high pressures deposited films had a (040) preferred orientation. A 900 C anneal in flowing oxygen for a film deposited at low oxygen pressures resulted in a decrease in the lattice parameter (associated with an increase in {delta}) and a change in the preferred orientation from (202) to (040). The resistivity as a function of temperature (R(T)) showed a significant variation as a function of growth conditions. At 600 C, the peak in the resistivity curve (T{sub m}) varied between 73 and 93 K for P(O{sub 2}) = 15 to 400 mTorr, while at 700 C, T{sub m} was {approximately}150 K. For films deposited at 500 C, the resistivity was reduced by a factor of 10{sup 3} for H = 9T and T{sub m} was shifted to 150 K. The activation energy associated with the semiconducting phase was approximately the same for all as-deposited films ({approximately}100 meV).
- OSTI ID:
- 392205
- Report Number(s):
- CONF-951155--; ISBN 1-55899-304-5
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ALUMINATES
CALCIUM OXIDES
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
LANTHANUM COMPOUNDS
LANTHANUM OXIDES
LASERS
LATTICE PARAMETERS
MANGANESE OXIDES
ORIENTATION
ORTHORHOMBIC LATTICES
OXYGEN
SUBSTRATES
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION
ALUMINATES
CALCIUM OXIDES
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
LANTHANUM COMPOUNDS
LANTHANUM OXIDES
LASERS
LATTICE PARAMETERS
MANGANESE OXIDES
ORIENTATION
ORTHORHOMBIC LATTICES
OXYGEN
SUBSTRATES
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION