Epitaxial growth and physical properties of La{sub 1{minus}x}Ca{sub x}MnO{sub 3{minus}{delta}} thin films on MgO(001) substrates
- Seoul National Univ. (Korea, Republic of)
- LG Electronics Research Center, Seoul (Korea, Republic of)
Perovskite La{sub 1{minus}x}Ca{sub x}MnO{sub 3{minus}{delta}} (LCMO) thin films with a wide range of x, i.e., 0.0 {le} x {le} 0.6, were deposited on MgO(001) substrates using a pulsed laser deposition (PLD) technique. Epitaxial La{sub 0.7}Ca{sub 0.3}MnO{sub 3{minus}{delta}}/MgO thin films were able to be grown under a condition such as 1.5--2.1 J/cm{sup 2} of a laser fluence, 650--750 C of a substrate temperature, and 100--300 mtorr of an oxygen pressure. X-ray pole figures and electron diffraction pattern showed that the LCMO films were grown epitaxially on MgO(001). Rutherford Backscattering Spectroscopy measurements investigated that the epitaxial LCMO films have compositions similar to those of targets, demonstrating the PLD is a useful technique to get films with complicated chemical compositions. Various physical properties, including resistance, R, magnetoresistance, {Delta}R/R(H = 0) {triple_bond} (R(H)-R(0))/R(0), and magnetization, M(T), were measured. The LCMO thin films with 0.2 {le} x {le} 0.5 had both semiconductor-metal and ferromagnetic ordering transitions, whose temperatures are located close to each other. These physical properties were explained in terms of the magnetic polaron model.
- OSTI ID:
- 392198
- Report Number(s):
- CONF-951155--; ISBN 1-55899-304-5
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
CALCIUM OXIDES
CHEMICAL COMPOSITION
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
ELECTRON DIFFRACTION
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
LANTHANUM OXIDES
LASERS
MAGNETIC PROPERTIES
MAGNETIC STORAGE DEVICES
MAGNETORESISTANCE
MANGANESE OXIDES
MATERIALS
OXYGEN
PHYSICAL PROPERTIES
RUTHERFORD SCATTERING
TEMPERATURE DEPENDENCE
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION