High temperature superconducting step-edge SNS Josephson junctions on silicon substrates

Book · Fri Nov 01 04:00:00 EST 1996

OSTI ID:392172

Rosenthal, P A; Cosgrove, J E; Fenner, D B; Rudman, D A ^[1]; Vale, L R; Ono, R H ^[2]

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1. Advanced Fuel Research, Inc., East Hartford, CT (United States)
2. NIST, Boulder, CO (United States)

The authors have fabricated and tested YBCO step-edge SNS Josephson junctions on silicon substrates. The silicon step edges were patterned photolithographically and reactively ion etched using an SF{sub 6} plasma. The structures were fabricated through sequential angled pulsed laser deposition of yttria stabilized zirconia, YBCO, and gold layers, followed by photolithographic patterning and ion milling. The completed devices showed resistively shunted junction (RSJ)-like current voltage characteristics and microwave induced Shapiro Steps. Critical currents as large as 84 {micro}A and resistances of order 0.5 {Omega} were obtained. Measurable critical currents were observed up to 76 K. The authors report on the fabrication and properties of these junctions.

• OSTI ID: 392172
• Report Number(s): CONF-951155--; ISBN 1-55899-304-5
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING
BARIUM OXIDES
COMPOSITE MATERIALS
COPPER OXIDES
CRITICAL CURRENT
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
ELECTRONIC EQUIPMENT
ENERGY BEAM DEPOSITION
ETCHING
EXPERIMENTAL DATA
GOLD
LASERS
MILLING
MORPHOLOGY
SCANNING ELECTRON MICROSCOPY
SUPERCONDUCTIVITY
TEMPERATURE DEPENDENCE
YTTRIUM OXIDES
ZIRCONIUM OXIDES