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Epitaxial growth and structure of cubic and pseudocubic perovskite films on perovskite substrates

Book ·
OSTI ID:392158
; ;  [1];  [2]
  1. Max-Planck-Inst. fuer Metallforschung, Stuttgart (Germany). Inst. fuer Werkstoffwissenschaft
  2. Univ. of California, Santa Barbara, CA (United States)

Cubic and pseudocubic perovskite films on perovskite substrates are used to study the influence of the lattice mismatch on the epitaxial growth of thin films on substrates of the same structure. For the growth of the films, a metalorganic decomposition route (MOD) using 2-ethylhexanoates and neodecanoates as precursors, was developed. The decomposition of the precursors was investigated with thermogravimetric analysis (TGA) and x-ray diffraction (XRD). The films were pin-coated on (001)-oriented SrTiO{sub 3}- and LaAlO{sub 3}-substrates, pyrolyzed and afterwards annealed between 600 C and 1,200 C. XRD-investigations and conventional transmission electron microscopy (CTEM) show, that epitaxial films with the orientation relationship [100](001) film {parallel} [100](001) substrate can be grown. With XRD, it could be shown, that not only ternary oxide films (SrZrO{sub 3}, BaZrO{sub 3} and BaCeO{sub 3}), but also perovskite solid solution films (SrTi{sub 0.5}Zr{sub 0.5}O{sub 3} and BaCe{sub 0.5}Zr{sub 0.5}O{sub 3}) can be prepared. Strong interdiffusion, detected by a shift of the film lattice parameter towards the substrate lattice parameter was found in SrZrO{sub 3}- and BaZrO{sub 3}-films on SrTiO{sub 3}, annealed at temperatures above 1050 C. High resolution electron microscopy (HREM) studies of SrZrO{sub 3} on SrTiO{sub 3} show that a crystalline semicoherent interface with a periodical array of misfit dislocations is present.

OSTI ID:
392158
Report Number(s):
CONF-951155--; ISBN 1-55899-304-5
Country of Publication:
United States
Language:
English