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Title: Design of a dedicated beamline for x-ray microfocusing- and coherence-based techniques at the Advanced Photon Source

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147340· OSTI ID:389619
; ; ; ; ; ;  [1]
  1. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)

A dedicated insertion-device beamline has been designed and is being constructed at the Advanced Photon Source (APS) for development of x-ray microfocusing- and coherence-based techniques and applications. Important parameters considered in this design include preservation of source brilliance and coherence, selectable transverse coherence length and energy bandwidth, high beam angular stability, high order harmonic suppression, quick x-ray energy scan, and accurate and stable x-ray energy. The overall design of this beamline layout and the major beamline components are described. The use of a horizontally deflecting mirror as the first optical component is one of the main features of this beamline design, and the resulting advantages are briefly discussed. {copyright} {ital 1996 American Institute of Physics.}

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
389619
Report Number(s):
CONF-9510119-; ISSN 0034-6748; TRN: 96:028034
Journal Information:
Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English