Design of a dedicated beamline for x-ray microfocusing- and coherence-based techniques at the Advanced Photon Source

Journal Article · Sun Sep 01 04:00:00 EDT 1996 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147340· OSTI ID:389619

Yun, W; Lai, B; Shu, D; Khounsary, A; Cai, Z; Barraza, J; Legnini, D ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)

A dedicated insertion-device beamline has been designed and is being constructed at the Advanced Photon Source (APS) for development of x-ray microfocusing- and coherence-based techniques and applications. Important parameters considered in this design include preservation of source brilliance and coherence, selectable transverse coherence length and energy bandwidth, high beam angular stability, high order harmonic suppression, quick x-ray energy scan, and accurate and stable x-ray energy. The overall design of this beamline layout and the major beamline components are described. The use of a horizontally deflecting mirror as the first optical component is one of the main features of this beamline design, and the resulting advantages are briefly discussed. {copyright} {ital 1996 American Institute of Physics.}

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 389619
• Report Number(s): CONF-9510119--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 67; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADVANCED PHOTON SOURCE
BEAM TRANSPORT
COHERENT RADIATION
DESIGN
FOCUSING
PHOTON BEAMS
SYNCHROTRON RADIATION
USES
X RADIATION