A beamline for 1{endash}4 keV microscopy and coherence experiments at the Advanced Photon Source

Journal Article · Sun Sep 01 04:00:00 EDT 1996 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147339· OSTI ID:389618

McNulty, I; Khounsary, A; Feng, Y; Qian, Y; Barraza, J; Benson, C; Shu, D ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 (United States)

The third-generation Advanced Photon Source will open up dramatic new opportunities for experiments requiring coherent x-rays, such as scanning x-ray microscopy, interferometry, and coherent scattering. We are building a beamline at the Advanced Photon Source to exploit the potential of coherent x-ray applications in the 1{endash}4 keV energy region. A high brightness 5.5-cm-period undulator supplies the coherent x-rays. The beamline uses horizontally deflecting grazing-incidence optical elements to preserve the coherence of the undulator beam. The optics have multilayer coatings for operation at energies above 1.5 keV. This paper discusses the beamline design and its expected performance. {copyright} {ital 1996 American Institute of Physics.}

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 389618
• Report Number(s): CONF-9510119--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 67; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADVANCED PHOTON SOURCE
ANL
COHERENT RADIATION
DESIGN
INTERFEROMETRY
KEV RANGE 01-10
MICROSCOPY
OPTICAL SYSTEMS
PERFORMANCE
PHOTON BEAMS
SYNCHROTRON RADIATION
USES
X RADIATION