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Title: Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

Journal Article · · Journal of Synchrotron Radiation (Online)

In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ('pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. As a result, the methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1454336
Alternate ID(s):
OSTI ID: 1454505
Journal Information:
Journal of Synchrotron Radiation (Online), Journal Name: Journal of Synchrotron Radiation (Online) Vol. 25 Journal Issue: 4; ISSN 1600-5775
Publisher:
International Union of Crystallography (IUCr)Copyright Statement
Country of Publication:
Denmark
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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