Intrinsic noise temperatures of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} Josephson devices on bicrystal substrates and the upper frequency limit for their operation
- Research Institute of Electrical Communication, Tohoku University, Aoba-ku, Sendai 980-77 (Japan)
- Department of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)
Following a method proposed by Divin and Modovets [Sov. Tech. Phys. Lett. {bold 9}, 108 (1983)], we have measured at millimeter waveband the intrinsic noise temperatures {ital T}{sub {ital N}} of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} Josephson junctions or dc superconducting quantum interference devices (SQUIDs) fabricated on SrTiO{sub 3}, yttria-stabilized ZrO{sub 2}, or Si bicrystal substrates. Over wide ranges of physical temperatures {ital T}{sub {ital P}} and the junction{close_quote}s normal resistance {ital R}{sub {ital N}}, it was found that {ital T}{sub {ital N}} follows {ital T}{sub {ital P}} pretty well. This indicates that the intrinsic noise in the devices is dominated by Johnson noise. {ital T}{sub {ital N}} was also measured in cases where there is external magnetic field applied, or where there is another microwave radiation like the local oscillator in a mixer. The magnetic field or microwave radiation does not seem to affect {ital T}{sub {ital N}} in any appreciable way. To estimate the high frequency performance of the junctions on Si bicrystal substrates, direct irradiation by a far infrared laser at 1.81 THz is carried out and the clear first Shapiro step is observed. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 389273
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 80; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
YBCO microwave grain boundary mixer using a SrTiO[sub 3] bicrystal substrate
Microwave properties of high-temperature Josephson contacts on a sapphire bicrystal substrate
Properties of the YBCO thin film interferometers fabricated on ZrO sub 2 bicrystal substrates
Conference
·
Sun Oct 31 23:00:00 EST 1993
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:6784025
Microwave properties of high-temperature Josephson contacts on a sapphire bicrystal substrate
Journal Article
·
Tue Nov 14 23:00:00 EST 2017
· Physics of the Solid State
·
OSTI ID:22771546
Properties of the YBCO thin film interferometers fabricated on ZrO sub 2 bicrystal substrates
Conference
·
Thu Feb 28 23:00:00 EST 1991
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:6089234