Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O{sub 3} films
- Joint Research Center for Atom Technology (JRCAT), National Institute for Advanced Interdisciplinary Research (NAIR), Tsukuba, Ibaraki 305 (Japan)
- MCNC, Electronics Technologies Division, Research Triangle Park, North Carolina 27709-2889 (United States)
- JRCAT, NAIR, Tsukuba, Ibaraki 305 (Japan)
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(Zr{sub {ital x}}Ti{sub 1{minus}{ital x}})O{sub 3} (PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of as-deposited PZT films on RuO{sub 2} and Pt electrodes. The PZT/RuO{sub 2} films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process was directly observed. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 389251
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 69; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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