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Title: Variation of the in-plane penetration depth {lambda}{sub {ital ab}} as a function of doping in La{sub 2{minus}{ital x}}Sr{sub {ital x}}CuO{sub 4{plus_minus}{delta}} thin films on SrTiO{sub 3}: Implications for the overdoped state

Journal Article · · Physical Review, B: Condensed Matter
 [1];  [2]; ;  [2];  [2]; ;  [1];  [3];  [4]
  1. IBM Research Division, Zurich Research Laboratory, 8803 Rueschlikon (Switzerland)
  2. IBM Research Division, Zurich Research Laboratory, 8803 Rueschlikon, Switzerl
  3. Departement de Physique de la Matiere Condensee, Universite de Geneve, 1211 Geneve (Switzerland)
  4. Institut de Physique, Universite de Neuchatel, 2000 Neuchatel (Switzerland)

Normal-state properties, such as the resistivity {rho}{sub {ital ab}} and the Hall coefficient {ital R}{sub {ital H}}, structural properties, such as the {ital c} axis and in-plane lattice parameters, and superconductive properties, such as the critical temperature {ital T}{sub {ital c}}, the penetration depth {lambda}{sub {ital ab}}, and the thermal activation energy for flux flow {Delta}{ital U}, are reported for {ital c}-axis La{sub 2{minus}{ital x}}Sr{sub {ital x}}CuO{sub 4{plus_minus}{delta}} films. These parameters have been measured as a function of doping in the range from heavily underdoped to heavily overdoped. The structural data indicate a 0.3{percent} compression of the {ital c}-axis parameter and a corresponding 0.3{percent} expansion of the in-plane lattice parameters as compared to bulk values, which explains the overall reduced critical temperature of these thin films. As the dopant content is increased, maximum values for {ital T}{sub {ital c}}, {Delta}{ital U}, and {lambda}{sub {ital ab}}{sup {minus}1} are observed close to optimum doping, while {ital R}{sub {ital H}} and {rho}{sub {ital ab}} decrease monotonically. {copyright} {ital 1996 The American Physical Society.}

OSTI ID:
388949
Journal Information:
Physical Review, B: Condensed Matter, Vol. 54, Issue 10; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English