Measurement of {sup B(D0{yields}K-{pi}+{pi}o})/{sub B(D0{yields}K-{pi}+)}
Journal Article
·
· Bulletin of the American Physical Society
OSTI ID:375008
Using the 3.2fb{sup {minus}1} data set accumulated by CLEO II at the Cornell Electron Storage Ring, the authors make the most precise measurement of B(D{sup 0} {yields} K{sup {minus}}{pi}{sup +}{pi}{sup 0})/B(D{sup 0} {yields} K{sup {minus}}{pi}{sup +}) to date. Due to the high statistics available, the error on this result is dominated by the systematic uncertainty. When this measurement is combined with the CLEO II measurement of the absolute branching fraction for D{sup 0} {yields} K{sup {minus}}{pi}{sup +}, they obtain an absolute branching fraction for D{sup 0} {yields} K{sup {minus}}{pi}{sup +}{pi}{sup 0}.
- OSTI ID:
- 375008
- Report Number(s):
- CONF-9304297--
- Journal Information:
- Bulletin of the American Physical Society, Journal Name: Bulletin of the American Physical Society Journal Issue: 2 Vol. 40; ISSN 0003-0503; ISSN BAPSA6
- Country of Publication:
- United States
- Language:
- English
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