Scanning probe microscopy studies of semiconductor surfaces
Conference
·
OSTI ID:370798
- Univ. of California, Santa Barbara, CA (United States)
Recent work involving atomic force microscopy and scanning tunneling microscopy is discussed which involves strain-induced, self-assembling nanostructures in compound semiconductor materials. Specific examples include one-dimensional quantum wires of InAs grown by MBE on GaAs(001) and zero-dimensional quantum dots of InP grown by MOCVD on InGaP which is lattice matched to GaAs(001).
- OSTI ID:
- 370798
- Report Number(s):
- CONF-960376--
- Country of Publication:
- United States
- Language:
- English
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