The characterisation of microtexture by orientation mapping
Journal Article
·
· Advances in X-Ray Analysis
- Institut fuer Metallkunde und Metallphysik, Clausthal-Z (Germany)
For a complete description of a material`s microstructure the morphology as well as the distributions of chemical elements and of crystal lattice orientations must be known. While morphogy is a standard issue of electron microscopy, and element distributions can be mapped readily using an EDX appliance, crystal lattice orientations in the bulk surface are accessible in routine work only recently. Backscatter Kikuchi patterns (BKP), also termed electron backscattering patterns (EBSP), are widely used for the determination of individual grain orientations in the surface of bulk polycrystals. 12 refs., 1 fig.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 369853
- Report Number(s):
- CONF-9408178--
- Journal Information:
- Advances in X-Ray Analysis, Journal Name: Advances in X-Ray Analysis Vol. 38; ISSN 0376-0308; ISSN AXRAAA
- Country of Publication:
- United States
- Language:
- English
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