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Induced recrystallization of CdTe thin films deposited by close-spaced sublimation

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.57998· OSTI ID:357200
; ; ; ;  [1];  [2]
  1. National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401 (United States)
  2. Southern University and AM College, Harding Boulevard, Baton Rouge, Louisiana 70813 (United States)

We have deposited CdTe thin films by close-spaced sublimation at two different temperature ranges. The films deposited at the lower temperature partially recrystallized after CdCl{sub 2} treatment at 350&hthinsp;{degree}C and completely recrystallized after the same treatment at 400&hthinsp;{degree}C. The films deposited at higher temperature did not recrystallize at these two temperatures. These results confirmed that the mechanisms responsible for changes in physical properties of CdTe films treated with CdCl{sub 2} are recrystallization and grain growth, and provided an alternative method to deposit CSS films using lower temperatures. {copyright} {ital 1999 American Institute of Physics.}

Research Organization:
National Renewable Energy Laboratory
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-83CH10093
OSTI ID:
357200
Report Number(s):
CONF-980935--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 462; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English