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Title: Accelerated exposure tests of encapsulated Si solar cells and encapsulation materials

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.58000· OSTI ID:355402
;  [1]
  1. Engineering and Reliability Division, National Center for Photovoltaics, National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, Colorado 80401 (United States)

We have conducted a series of accelerated exposure test (AET) studies for various crystalline-Si (c-Si) and amorphous-Si (a-Si) cell samples that were encapsulated with different superstrates, pottants, and substrates. Nonuniform browning patterns of ethylene vinyl acetate (EVA) pottants were observed for glass/EVA/glass-encapsulated c-Si cell samples under solar simulator exposures at elevated temperatures. The polymer/polymer-configured laminates with Tedlar or Tefzel did not discolor because of photobleaching reactions, but yellowed with polyester or nylon top films. Delamination was observed for the polyester/EVE layers on a-Si minimodules and for a polyolefin-based thermoplastic pottant at high temperatures. For all tested c-Si cell samples, irregular changes in the current-voltage parameters were observed that could not be accounted for simply by the transmittance changes of the superstrate/pottant layers. Silicone-type adhesives used under UV-transmitting polymer top films were observed to cause greater cell current/efficiency loss than EVA or polyethylene pottants. {copyright} {ital 1999 American Institute of Physics.}

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-83CH10093
OSTI ID:
355402
Report Number(s):
CONF-980935-; ISSN 0094-243X; TRN: 9915M0082
Journal Information:
AIP Conference Proceedings, Vol. 462, Issue 1; Conference: 15. National Center for Photovoltaics program review conference, Denver, CO (United States), 9-11 Sep 1998; Other Information: PBD: Mar 1999
Country of Publication:
United States
Language:
English