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Junction formation in CuInSe{sub 2}-based thin-film devices

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.57948· OSTI ID:355356
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  1. National Center for Photovoltaics, National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401 (United States)
The nature of the interface between CuInSe{sub 2} (CIS) and the chemical bath deposited CdS layer has been investigated. We show that heat-treating the absorbers in Cd- or Zn-containing solutions in the presence of ammonium hydroxide sets up a chemical reaction which facilitates an extraction of Cu from the lattice and an in-diffusion of Cd. The characteristics of devices made in this manner suggest that the reaction generates a thin, n-doped region in the absorber. It is quite possible that the CdS/CuInSe{sub 2} device is a buried, shallow junction with a CdS window layer, rather than a heterojunction. We have used these ideas to develop methods for fabricating devices without CdS or Cd. A 14.2{percent} efficiency ZnO/CIGS device was obtained through aqueous treatment in Zn solutions. {copyright} {ital 1999 American Institute of Physics.}
Research Organization:
National Renewable Energy Laboratory
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-83CH10093
OSTI ID:
355356
Report Number(s):
CONF-980935--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 462; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English