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The shape of self-assembled InAs islands grown by molecular beam epitaxy

Journal Article · · Journal of Electronic Materials
; ;  [1];  [2]
  1. Univ. of Oregon, Eugene, OR (United States)
  2. National Renewable Energy Lab., Golden, CO (United States)

The authors have determined the shape of InAs quantum dots using reflection high energy electron diffraction. The results indicate that self-assembled InAs islands possess a pyramidal shape with {l_brace}136{r_brace} bounding facets. This shape is characterized by C{sub 2{upsilon}} symmetry and a parallelogram base, which is elongated along the [1{bar 1}0] direction. Cross-sectional transmission electron microscopy images taken along the [110] and [1{bar 1}0] directions as well as atomic force microscopy images strongly support the {l_brace}136{r_brace} shape. Furthermore, polarization-resolved photoluminescence spectra show strong in-plane anisotropy, with emission predominantly polarized along the [1{bar 1}0] direction, consistent with the proposed quantum dot shape.

OSTI ID:
353456
Journal Information:
Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 5 Vol. 28; ISSN JECMA5; ISSN 0361-5235
Country of Publication:
United States
Language:
English

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