RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization

Journal Article · Mon Feb 01 00:00:00 EST 1999 · Materials Characterization

DOI:https://doi.org/10.1016/S1044-5803(98)00058-8· OSTI ID:349853

Caudron, E; Buscail, H ^[1]; Jacob, Y P; Stroosnijder, M F ^[2]

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1. Equipe Locale Univ. Blaise Pascal Clermont-Fd II, Le Puy en Velay (France). Lab. Vellave d`Elaboration et d`Etude des Materiaux
2. European Commission, Ispra (Italy). Inst. for Advanced Materials

Extra low carbon steel samples were yttrium implanted using an ion implantation method. Composition and structural studies were carried out before and after yttrium implantations by several analytical and structural techniques (Rutherford backscattering spectrometry, reflection high energy electron diffraction, scanning electron microscopy, X-ray diffraction, and glancing angle X-ray diffraction) to characterize the yttrium implantation effect on extra low carbon steel. The aim of this article is to show the contributions of Rutherford back-scattering spectrometry (RBS) and glancing angle X-ray diffraction (GAXRD) to the determination of yttrium depth profiles in the samples. The results obtained by these techniques are compared to those of the other analyses performed in this work to show the existing correlation between composition and structural studies. Their results allow a better understanding of the effect of yttrium implantation in extra low carbon steel before studying their corrosion resistance at high temperature.

• OSTI ID: 349853
• Journal Information: Materials Characterization, Vol. 42, Issue 2-3; Other Information: PBD: Feb-Mar 1999
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
MICROSTRUCTURE
ION IMPLANTATION
CARBON STEELS
YTTRIUM ADDITIONS
CHEMICAL COMPOSITION
RUTHERFORD SCATTERING
X-RAY DIFFRACTION
CORRELATIONS