Radiation effects on front-end electronics for noble liquid calorimetry

Technical Report · Wed Nov 30 23:00:00 EST 1994

DOI:https://doi.org/10.2172/34408· OSTI ID:34408

Citterio, M; Rescia, S; Radeka, V

Front-end electronics for liquid ionization chamber calorimetry at hadron collider experiments may be exposed to substantial levels of ionizing radiation and neutron fluences in a cryogenic environment. Measurements of devices built with rad-hard technologies have shown that devices able to operate in these conditions exist. Si-JFETs and GaAs MESFET devices have been irradiated and tested at a stable cryogenic temperature up to doses of 55 Mrad of ionizing radiation and up to neutron fluences of 4 {times} 10{sup 14} n/cm{sup 2}. Radiation effects on DC characteristics and on noise will be presented.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 34408
• Report Number(s): BNL--61327; CONF-9409268--8; ON: DE95007304
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ACCELERATORS
ELECTRICAL PROPERTIES
ELECTRONIC EQUIPMENT
EXPERIMENTAL DATA
FIELD EFFECT TRANSISTORS
GALLIUM ARSENIDES
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
SHOWER COUNTERS
SILICON