Consistent time-of-flight mobility measurements and polymer light-emitting diode current{endash}voltage characteristics

Journal Article · Sat May 01 04:00:00 EDT 1999 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.124021· OSTI ID:338659

Campbell, I H; Smith, D L ^[1]; Neef, C J; Ferraris, J P ^[2]

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1. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
2. The University of Texas at Dallas, Richardson, Texas 75083 (United States)

We present time-of-flight mobility measurements and measured and calculated current{endash}voltage (I{endash}V) characteristics of structures fabricated using a soluble poly({ital p}-phenylene vinylene) derivative. Time-of-flight measurements were used to determine the electric field dependent hole mobility. This mobility was then used, without adjustable parameters, to calculate the I{endash}V characteristics of space-charge-limited, hole only devices. The measured and calculated I{endash}V characteristics are in good agreement over five orders of magnitude in current. These results demonstrate that an electric field dependent mobility, without invoking trapping effects, provides an accurate description of hole transport in this polymer. {copyright} {ital 1999 American Institute of Physics.}

• OSTI ID: 338659
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 19 Vol. 74; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ELECTRIC FIELDS
HOLE MOBILITY
LIGHT EMITTING DIODES
ORGANIC SEMICONDUCTORS
POLYMERS
TIME-OF-FLIGHT METHOD
TRAPPING