X-ray microdiffraction studies to measure strain fields in a metal matrix composite

Journal Article · Fri Jan 01 04:00:00 EST 1999 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1149561· OSTI ID:328540

Lee, H; Kupperman, D ^[1]; Yun, W; Cai, Z; Rodrigues, W ^[2]

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1. Energy Technology Division, Argonne National Laboratory, Argonne, Illinois, 60439 (United States)
2. Experimental Facility Division, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois, 60439 (United States)

An x-ray diffraction microscope (XDM) has been used to map the strain field in a fiber-reinforced composite material. The monochromatic x-ray (11 keV) beam was focused by a phase zone plate to produce a focal spot of 1{times}4 {mu}m{sup 2} on the specimen. The microfocusing method using a zone plate enables the XDM to produce a high spatial resolution of {approximately}1 {mu}m. The change in the peak position of diffraction patterns due to interatomic spacing change, caused by stress in the sample, was measured by using a two-dimensional charge coupled device detector. The radial residual strain field in the fiber-reinforced composite (SCS{endash}6/Ti{endash}14Al{endash}21Nb) was measured from diffraction patterns with a sensitivity of {approximately}10{sup {minus}4} and an average standard deviation of 9.4{times}10{sup {minus}5}.

• OSTI ID: 328540
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 70; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
COMPOSITE MATERIALS
FIBERS
KEV RANGE 10-100
METALS
STRAINS
X-RAY DIFFRACTION