X-ray microdiffraction studies to measure strain fields in a metal matrix composite

Journal Article · Tue Jul 01 04:00:00 EDT 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.54617· OSTI ID:21179508

Lee, Heung-Rae; Wenbing, Yun; Zhonghou, Cai; Rodrigues, William ^[1]; Kupperman, Davis S ^[2]

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1. Experimental Facility Division at Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Energy Technology Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

An x-ray diffraction microscope has been used to map the strain field in a fiber-reinforced composite material. The monochromatic x-ray (11 keV) beam was focused by a phase zone plate to produce a focal spot of 1x4 {mu}m{sup 2} on the specimen. The change in the peak position of diffraction patterns due to interatomic spacing change, caused by stress in the sample, was measured by using a two-dimensional CCD detector. The radial residual strain field in the fiber-reinforced composite (SCS-6/Ti-14Al-21Nb) was measured from diffraction patterns with a sensitivity of {approx}10{sup -4} and an average standard deviation of 9.4x10{sup -5}.

• OSTI ID: 21179508
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 417; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHARGE-COUPLED DEVICES
COMPOSITE MATERIALS
FIBERS
KEV RANGE
METALS
MONOCHROMATIC RADIATION
PLATES
REINFORCED MATERIALS
SENSITIVITY
STRAINS
STRESSES
X-RAY DIFFRACTION