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Measurement of the B{sub S}{sup 0} meson lifetime using semileptonic decays

Journal Article · · Physical Review, D
OSTI ID:328536
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  1. Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  2. Istituto Nazionale di Fisica Nucleare, University of Bologna, I-40127 Bologna (Italy)
  3. Brandeis University, Waltham, Massachusetts 02254 (United States)
  4. University of California at Los Angeles, Los Angeles, California 90024 (United States)
  5. University of Chicago, Chicago, Illinois 60637 (United States)
  6. Duke University, Durham, North Carolina 27708 (United States)
  7. Fermi National Accelerator Laboratory, Batavia, Illinois 60510 (United States)
  8. University of Florida, Gainesville, Florida 32611 (United States)
  9. Laboratori Nazionali di Frascati, Istituto Nazionale di Fisica Nucleare, I-00044 Frascati (Italy)
  10. University of Geneva, CH-1211 Geneva 4 (Switzerland)
The lifetime of the B{sub S}{sup 0} meson is measured using the semileptonic decay B{sub S}{sup 0}{r_arrow}D{sub S}{sup {minus}}l{sup +}{nu}X. The data sample consists of about 110 pb{sup {minus}1} of p{bar p} collisions at {radical} (s) =1.8 TeV collected by the CDF detector at Fermilab. Four different D{sub S}{sup {minus}} decay modes are reconstructed resulting in approximately 600 D{sub S}{sup {minus}}l{sup +} signal events. The B{sub S}{sup 0} meson lifetime is determined to be {tau}(B{sub S}{sup 0})=(1.36{plus_minus}0.09{sub {minus}0.05}{sup +0.06}) ps, where the first and second uncertainties are statistical and systematic, respectively. The B{sub S}{sup 0} meson decay length distribution is examined for a lifetime difference {Delta}{Gamma}/{Gamma} between the two mass eigenstates of the B{sub S}{sup 0} meson. An upper limit of {Delta}{Gamma}/{Gamma}{lt}0.83 is set at the 95{percent} confidence level. {copyright} {ital 1999} {ital The American Physical Society}
OSTI ID:
328536
Journal Information:
Physical Review, D, Journal Name: Physical Review, D Journal Issue: 3 Vol. 59; ISSN PRVDAQ; ISSN 0556-2821
Country of Publication:
United States
Language:
English

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