Laser-induced fluorescence technique for measuring damage to a fluorescent lamp electrode
Conference
·
OSTI ID:323627
- Rensselaer Polytechnic Inst., Troy, NY (United States)
The proliferation of solid-state electronic ballasts for fluorescent lamps has led to many different starting and operating scenarios for these lamps. Because these scenarios often differ from those described in relevant ANSI standards, the effects on the operating lives of lamps is not known. This paper describes a pilot study that used a laser-induced fluorescence (LIF) technique to directly measure the rate of barium loss from a fluorescent lamp electrode under a variety of starting and operating parameters. The experimental results are provided and the potential applications of the technique for commercial lighting products are discussed.
- OSTI ID:
- 323627
- Report Number(s):
- CONF-970559--
- Country of Publication:
- United States
- Language:
- English
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