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Saturation of the dose-rate response of bipolar transistors below 10 rad(SiO{sub 2})/s: Implications for hardness assurance

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.340625· OSTI ID:32040
 [1];  [2];  [3]
  1. Air Force Phillips Lab., Albuquerque, NM (United States). Microelectronics and Photonics Research Branch
  2. Sandia National Labs., Albuquerque, NM (United States)
  3. Univ. of Arizona, Tucson, AZ (United States). Dept. of Electrical and Computer Engineering

The gain degradation of modern bipolar transistors was investigated for dose rates ranging from 0.01 to {approximately}2,000 rad(SiO{sub 2})/s. Five different radiation sources were used for the exposures: three {sup 60}Co sources, a 10-keV x-ray source, and a {sup 137}Cs source. The {sup 137}Cs exposures at 0.01 rad(SiO{sub 2})/s are two orders of magnitude lower in dose rate than any previous irradiations for this process and thus facilitate comparison to the device response in space. Low-dose-rate gain degradation exceeds high-dose-rate degradation for total doses less than 1 Mrad(SiO{sub 2}), consistent with previous reports. For the first time, the gain degradation is demonstrated to be equivalent for dose rates between 0.01 and 10 rad(SiO{sub 2})/s, suggesting that the dose-rate response saturates at {approximately}10 rad(SiO{sub 2})/s for the devices studied in this work. On the basis of a recent model, high-dose-rate irradiations at 60 C were performed and found to be consistent with the room-temperature, low-dose-rate, saturated response. These results suggest several promising new approaches to bipolar space-qualification testing.

OSTI ID:
32040
Report Number(s):
CONF-940726--
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 41; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

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