Effect of test method on the failure dose of SEEQ 28C256 EEPROM

Journal Article · Wed Nov 30 23:00:00 EST 1994 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.340570· OSTI ID:32035

Verkasalo, R ^[1]

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1. VTT Electronics, Oulu (Finland)

Two lots of SEEQ 28C256 EEPROM were tested for total dose tolerance. Differences between them were found to result in a dependent of the relative superiority and failure doses of the two lots on the test method and the failure criterion. The failure doses were between 6 and 15 krad, and the failure mechanisms were an increase in the standby current and a loss of programmability.

• OSTI ID: 32035
• Report Number(s): CONF-940726--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 41; ISSN IETNAE; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
EXPERIMENTAL DATA
FAILURES
MEMORY DEVICES
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
SPACE FLIGHT