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Hydrogen in GaN-experiments

Conference ·
OSTI ID:308113
 [1];  [2];  [3];  [4]; ; ;  [5]
  1. Univ. of Florida, Gainesville, FL (United States). Dept. of Materials Science and Engineering
  2. Plasma-Therm, Inc., St. Petersburg, FL (United States)
  3. Wilson, R.G., Stevenson Ranch, CA (United States)
  4. Army Research Office, Research Triangle Park, NC (United States)
  5. Lehigh Univ., Bethlehem, PA (United States). Dept. of Physics

Hydrogen is an important component of the gas phase growth chemistry for GaN (e.g., NH{sub 3}, (CH{sub 3}){sub 3} Ga) and the processing environment for subsequent device fabrication (e.g., SiH{sub 4} for dielectric deposition, NH{sub 3} or H{sub 2} annealing ambients), and is found to readily permeate into heteroepitaxial material at temperatures {le}200 C. Its main effect has been the passivation of Mg acceptors in p-GaN through formation of neutral Mg-H complexes, which can be dissociated through minority-carrier (electron) injection or simple thermal annealing. Atomic hydrogen is also found to passivate a variety of other species in GaN, as detected by a change in the electrical or optical properties of the material. An example is the increase in luminescence efficiency of Er{sup 3+} ions in AlN after hydrogenation, through passivation of non-radiative states that would be an alternative path for de-excitation. The injection of hydrogen during a large variety of device fabrication steps has been detected by SIMS profiling using {sup 2}H isotopic labeling. Basically all of the acceptor species in GaN, namely Mg, C, Ca and Cd are found to form complexes with hydrogen.

Sponsoring Organization:
National Science Foundation, Washington, DC (United States); Office of Naval Research, Washington, DC (United States)
OSTI ID:
308113
Report Number(s):
CONF-980405--
Country of Publication:
United States
Language:
English

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