A new method for the determination of the minority carrier lifetime based on a biased OCVD technique
- CNEA, Buenos Aires (Argentina)
A new simple method for the determination of the minority carrier lifetime ({tau}), based on a biased OCVD technique, is analyzed. In this case the excitation is given by a pulsed light source (time dependent contribution) plus a continuous illumination (continuous forward bias). Under appropriate conditions this configuration produces an exponential decay with a time constant which depends on the bias. This constant decreases monotonously as a function of bias and allows to determine an effective {tau} for the base region. An inexpensive equipment has been developed. It basically consists in two sets of high efficiency GaAs LED`s, which provide both light contributions. Measurements have been done on crystalline silicon solar cells fabricated in the Argentine Atomic Energy Commission. Experimental results show good agreement with the theoretical model and with numerical PC-1D simulations.
- OSTI ID:
- 302467
- Report Number(s):
- CONF-970953-; TRN: IM9904%%255
- Resource Relation:
- Conference: 26. IEEE photovoltaic specialists conference, Anaheim, CA (United States), 29 Sep - 3 Oct 1997; Other Information: PBD: 1997; Related Information: Is Part Of Conference record of the twenty sixth IEEE photovoltaic specialists conference -- 1997; PB: 1477 p.
- Country of Publication:
- United States
- Language:
- English
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