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Title: Automated indexing of Laue images from polycrystalline materials

Abstract

Third generation hard x-ray synchrotron sources and new x-ray optics have revolutionized x-ray microbeams. Now intense sub-micron x-ray beams are routinely available for x-ray diffraction measurement. An important application of sub-micron x-ray beams is analyzing polycrystalline material by measuring the diffraction of individual grains. For these measurements, conventional analysis methods will not work. The most suitable method for microdiffraction on polycrystalline samples is taking broad-bandpass or white-beam Laue images. With this method, the crystal orientation and non-isostatic strain can be measured rapidly without rotation of sample or detector. The essential step is indexing the reflections from more than one grain. An algorithm has recently been developed to index broad bandpass Laue images from multi-grain samples. For a single grain, a unique set of indices is found by comparing measured angles between Laue reflections and angles between possible indices derived from the x-ray energy bandpass and the scattering angle 2 theta. This method has been extended to multigrain diffraction by successively indexing points not recognized in preceding indexing iterations. This automated indexing method can be used in a wide range of applications.

Authors:
;  [1]
  1. Oak Ridge National Lab., TN (United States). Metals and Ceramics Div.
Publication Date:
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
302387
Report Number(s):
CONF-980405-
Journal ID: ISSN 0272-9172; TRN: 99:002619
DOE Contract Number:  
AC05-96OR22464
Resource Type:
Conference
Resource Relation:
Conference: Spring meeting of the Materials Research Society, San Francisco, CA (United States), 13-17 Apr 1998; Other Information: PBD: 1998; Related Information: Is Part Of Applications of synchrotron radiation techniques to materials science 4; Mini, S.M. [ed.] [Northern Illinois Univ., DeKalb, IL (United States)]|[Argonne National Lab., IL (United States)]; Stock, S.R. [ed.] [Georgia Inst. of Tech., Atlanta, GA (United States)]; Perry, D.L. [ed.] [Lawrence Berkeley National Lab., CA (United States)]; Terminello, L.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; PB: 398 p.; Materials Research Society symposium proceedings, Volume 524
Country of Publication:
United States
Language:
English
Subject:
66 PHYSICS; SYNCHROTRON RADIATION SOURCES; X-RAY DIFFRACTION; POLYCRYSTALS; LAUE METHOD; ALGORITHMS; PATTERN RECOGNITION

Citation Formats

Chung, J S, and Ice, G E. Automated indexing of Laue images from polycrystalline materials. United States: N. p., 1998. Web.
Chung, J S, & Ice, G E. Automated indexing of Laue images from polycrystalline materials. United States.
Chung, J S, and Ice, G E. Thu . "Automated indexing of Laue images from polycrystalline materials". United States.
@article{osti_302387,
title = {Automated indexing of Laue images from polycrystalline materials},
author = {Chung, J S and Ice, G E},
abstractNote = {Third generation hard x-ray synchrotron sources and new x-ray optics have revolutionized x-ray microbeams. Now intense sub-micron x-ray beams are routinely available for x-ray diffraction measurement. An important application of sub-micron x-ray beams is analyzing polycrystalline material by measuring the diffraction of individual grains. For these measurements, conventional analysis methods will not work. The most suitable method for microdiffraction on polycrystalline samples is taking broad-bandpass or white-beam Laue images. With this method, the crystal orientation and non-isostatic strain can be measured rapidly without rotation of sample or detector. The essential step is indexing the reflections from more than one grain. An algorithm has recently been developed to index broad bandpass Laue images from multi-grain samples. For a single grain, a unique set of indices is found by comparing measured angles between Laue reflections and angles between possible indices derived from the x-ray energy bandpass and the scattering angle 2 theta. This method has been extended to multigrain diffraction by successively indexing points not recognized in preceding indexing iterations. This automated indexing method can be used in a wide range of applications.},
doi = {},
journal = {},
issn = {0272-9172},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {12}
}

Conference:
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