Automated indexing of wide bandpass Laue images
An important goal of x-ray microdiffraction is to characterize texture and strain in two or three dimensions with micron resolution. With this scanning x-ray microdiffraction, it is essential to accelerate data collection and to automate the diffraction data analysis. One solution is to collect wide bandpass Laue images which have information equivalent to that of many monochromatic diffraction scans. However, to get a scanned image, tens of thousands of Laue images must be analyzed in reasonable time; automated indexing of Laue points is essential. By comparing measured angles between scattering vectors of Laue points to angles between possible indexes derived from the bandpass, a unique set of indexes can be found. Indexing multi-grain images can also be done by repeating the indexing process for points which do not match an allowed reflection.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 516012
- Report Number(s):
- CONF-9704138--1; ON: DE97007780
- Country of Publication:
- United States
- Language:
- English
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