Perturbative second-order optical susceptibility of bulk materials: a symmetry-enforced return to non-orthogonal localized basis sets
Journal Article
·
· Journal of Physics. Condensed Matter
- Univ. of Arkansas, Fayetteville, AR (United States)
The second-order optical susceptibility of semiconductors $$\chi^{(2)}_{ijk}(-2\omega;\omega,\omega)$$ finds application in metrology, spectroscopy, telecommunications, material characterization, and quantum information. Pioneering calculations of $$\chi^{(2)}_{ijk}(-2\omega;\omega,\omega)$$ utilized non-orthogonal Gaussian orbitals centered at atoms. That formulation transitioned into plane-wave-based algorithms as time went by. As of late, nevertheless, multiple tools for calculating optical susceptibilities have recast the problem using Wannier (i.e. localized) orbitals, making a comeback onto frameworks based on localized basis sets. Here, in this work, we present an approach for calculating $$\chi^{(2)}_{ijk}(-2\omega;\omega,\omega)$$ reliant on numerical pseudo-atomic orbitals (PAOs) within perturbation theory in the velocity gauge. Its salient feature is a calculation of ‘Slater–Koster-like’ two-center integrals of the momentum operator in between PAOs identified by symmetry. The approach was successfully tested on paradigmatic cubic silicon carbide (3C-SiC) and gallium arsenide, for which linear responses are contributed as well.
- Research Organization:
- Univ. of Arkansas, Fayetteville, AR (United States)
- Sponsoring Organization:
- National Science Foundation; USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0022120
- OSTI ID:
- 3017977
- Journal Information:
- Journal of Physics. Condensed Matter, Journal Name: Journal of Physics. Condensed Matter Journal Issue: 4 Vol. 38; ISSN 0953-8984; ISSN 1361-648X
- Publisher:
- IOP PublishingCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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