Structure and Electrochemical Properties of LiMn2O4 Thin Films
Conference
·
OSTI ID:2978
- ORNL
The structure and electrochemical properties of LiMn{sub 2}O{sub 4} films depend upon the deposition and annealing conditions. Films which were deposited by rf magnetron sputtering of LiMn{sub 2}O{sub 4} in Ar + N{sub 2} gas mixtures and annealed in O{sub 2} at temperatures between 400 to 1000{degrees}C had the cubic spinel structure with an a-axis length that increased linearly from 8.13 to 8.25 {Angstrom} with increasing anneal temperature. Thin-film lithium cells with cathodes of different a-axis lengths exhibited marked differences in their voltage profiles. In particular, the ratio of the capacities at 4 V and 3 V increased with the a-axis length. A defect model of LiMn{sub 2}O{sub 4} which is consistent with the structural and electrochemical data is represented by [Li{sub 1-y+z}Mn{sup 2+}{sub y-z}]{sub 8a}[Mn{sup 2+}{sub z}]{sub 16c}[Li{sub x}Mn{sub 2-x}]{sub 16d}O{sub 4}. Based on this model and the results of in-situ XRD measurements, it is proposed that Mn ions migrate from 8(a) tetrahedral sites to 16(c) octahedral sites on charging the cells in the 5V plateau.
- Research Organization:
- Oak Ridge National Laboratory; Oak Ridge, TN
- Sponsoring Organization:
- USDOE Office of Energy Research (ER)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 2978
- Report Number(s):
- ORNL/CP-100700; KC 02 02 02 0; ON: DE00002978
- Country of Publication:
- United States
- Language:
- English
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