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Magnetic x-ray dichroism in the spectroscopy of ultrathin magnetic alloy films

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.588802· OSTI ID:288422
;  [1]; ;  [2]; ; ;  [3]
  1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
  2. Physics Department, Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
  3. Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy and magnetic x-ray circular dichroism in x-ray absorption spectroscopy. FeNi and CoFe epitaxial films were grown on Cu(001), {ital in} {ital situ} and using MBE techniques. Because soft x-rays were used to probe the 2{ital p} and 3{ital p} core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously. Correlation of these magnetic techniques with compositional and structural information will be done. Ultimately, from studies such as this a complete determination of the structure-property relationships will be achievable. {copyright} {ital 1996 American Vacuum Society}

OSTI ID:
288422
Report Number(s):
CONF-9510389--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 14; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English