Magnetic x-ray dichroism in the spectroscopy of ultrathin magnetic alloy films
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
- Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
- Physics Department, Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
- Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy and magnetic x-ray circular dichroism in x-ray absorption spectroscopy. FeNi and CoFe epitaxial films were grown on Cu(001), {ital in} {ital situ} and using MBE techniques. Because soft x-rays were used to probe the 2{ital p} and 3{ital p} core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously. Correlation of these magnetic techniques with compositional and structural information will be done. Ultimately, from studies such as this a complete determination of the structure-property relationships will be achievable. {copyright} {ital 1996 American Vacuum Society}
- OSTI ID:
- 288422
- Report Number(s):
- CONF-9510389--
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 4 Vol. 14; ISSN JVTBD9; ISSN 0734-211X
- Country of Publication:
- United States
- Language:
- English
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