Magnetic x-ray linear dichroism in the photoelectron spectroscopy of ultrathin magnetic alloy films

Journal Article · Mon Apr 01 04:00:00 EST 1996 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.362262· OSTI ID:280065

Tobin, J G; Goodman, K W ^[1]; Mankey, G J; Willis, R F ^[2]; Denlinger, J D; Rotenberg, E; Warwick, A ^[3]

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1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
2. Physics Department University Park, Pennsylvania State University, Pennsylvania 16802 (United States)
3. Advanced Light Source, Lawrence Berkeley Laboratory Berkeley, California 94720 (United States)

The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy. FeNi and CoFe epitaxial films were grown on Cu(001), {ital in} {ital situ} and using molecular beam epitaxy techniques. The magnetic x-ray linear dichroism measurements were made at the Spectromicroscopy Facility of the Third Generation Advanced Light Source. Because soft x-rays were used to generate photoemission from the 3{ital p} core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously. {copyright} {ital 1996 American Institute of Physics.}

• Research Organization: Lawrence Livermore National Laboratory
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 280065
• Report Number(s): CONF-951101--
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 79; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
COBALT ALLOYS
ELECTRONIC STRUCTURE
IRON ALLOYS
MAGNETIC CIRCULAR DICHROISM
MAGNETIC MATERIALS
MAGNETIC STRUCTURE
MOLECULAR BEAM EPITAXY
NICKEL ALLOYS
PHOTOELECTRON SPECTROSCOPY
SOFT X RADIATION
SYNCHROTRON RADIATION
THIN FILMS