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Study of the metallized poly(phenylene-vinylene) film interface

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.49487· OSTI ID:288255
;  [1]; ; ; ;  [2];  [3]
  1. Laboratoire de Physique Cristalline, Institut des Materiaux de Nantes, 2 rue de la Houssiniere, 44072 Nantes Cedex 03 (France)
  2. Laboratoire de Chimie Physique --- Matiere et Rayonnement, URA 176, Universite Pierre et Marie Curie, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05 (France)
  3. Laboratoire des Materiaux Organiques aux Proprietes Specifiques, CNRS, BP 24, 69390 Vernaison (France)

We have studied the interface formed on polyparaphenylene-vinylene (PPV) thin film by chromium layer deposited by thermal evaporation. Comparison of attenuated total reflection infra-red spectra obtained in pristine and covered PPV films shows that new absorption bands emerge at 687, 1026 and 1392 cm{sup {minus}1} upon chromium deposition. The Cr 3d valence distributions obtained by electron induced x-ray emission spectroscopy with covered sample is shifted towards higher binding energies with regards to metallic chromium. The features found in both experiments are interpreted as the characteristics of a compound in the chromium on polymer interface. {copyright} {ital 1996 American Institute of Physics.}

Sponsoring Organization:
USDOE
OSTI ID:
288255
Report Number(s):
CONF-950119--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 354; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English